Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination
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چکیده
منابع مشابه
Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination.
A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated, using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacing...
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ژورنال
عنوان ژورنال: Proceedings of the National Academy of Sciences
سال: 1981
ISSN: 0027-8424,1091-6490
DOI: 10.1073/pnas.78.9.5293